The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2007

Filed:

Jan. 27, 2005
Applicants:

Jun Hatakeyama, Joetsu, JP;

Yuji Harada, Joetsu, JP;

Yoshio Kawai, Joetsu, JP;

Masaru Sasago, Hirakata, JP;

Masayuki Endo, Izumi, JP;

Shinji Kishimura, Itami, JP;

Kazuhiko Maeda, Tokyo, JP;

Haruhiko Komoriya, Kawagoe, JP;

Kazuhiro Yamanaka, Kawagoe, JP;

Inventors:

Jun Hatakeyama, Joetsu, JP;

Yuji Harada, Joetsu, JP;

Yoshio Kawai, Joetsu, JP;

Masaru Sasago, Hirakata, JP;

Masayuki Endo, Izumi, JP;

Shinji Kishimura, Itami, JP;

Kazuhiko Maeda, Tokyo, JP;

Haruhiko Komoriya, Kawagoe, JP;

Kazuhiro Yamanaka, Kawagoe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/039 (2006.01); G03F 7/30 (2006.01); C08F 18/20 (2006.01); C08F 118/00 (2006.01); C08F 120/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A chemically amplified resist composition using an alternating copolymer of α-trifluoroacrylic acid with norbornene as a base polymer lends itself to ArF laser lithographic micropatterning and is improved in transparency, plasma etching resistance, and line edge roughness.


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