The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7232695 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 19, 2007

Filed:

Jun. 10, 2005
Applicants:

Timothy H. Daubenspeck, Colchester, VT (US);

Jeffrey P. Gambino, Westford, VT (US);

Christopher D. Muzzy, Burlington, VT (US);

Wolfgang Sauter, Richmond, VT (US);

Jeffrey S. Zimmerman, Hinesburg, VT (US);

Inventors:

Timothy H. Daubenspeck, Colchester, VT (US);

Jeffrey P. Gambino, Westford, VT (US);

Christopher D. Muzzy, Burlington, VT (US);

Wolfgang Sauter, Richmond, VT (US);

Jeffrey S. Zimmerman, Hinesburg, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for determining the complete coverage of a passivating material on the final conductive interconnection of a wafer containing integrated circuits. A test structure with the dimensions of the final interconnections of the integrated circuits is formed during manufacture of the integrated circuits and used to determine complete coverage of the wafer by creating an opening in the passivating material at the test structure, the size of the opening being indicative of the complete coverage of the wafer.


Find Patent Forward Citations

Daubenspeck, Timothy. (2007). Method and apparatus for completely covering a wafer with a passivating material (U.S. Patent No. 7232695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7232695

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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