The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

Jun. 30, 2004
Applicants:

Jane-bai Lai, Hsin-Chu, TW;

Yi-lung Cheng, Danshuei Township, Taipei County, TW;

Inventors:

Jane-Bai Lai, Hsin-Chu, TW;

Yi-Lung Cheng, Danshuei Township, Taipei County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A plasma treatment method which is capable of extending the MTF (mean-time-to-failure) of metal interconnects fabricated on a semiconductor wafer substrate, is disclosed. The invention includes providing a trench typically in a dielectric layer on a substrate; depositing a metal in the trench; and exposing the metal to a nitrogen-based plasma. The plasma-treatment step accelerates grain growth and re-orients the grains in the metal to a closely-packed crystal orientation texture which approaches or approximates the <111> crystal orientation texture of copper.


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