The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Aug. 22, 2003
Applicants:

Kenneth S. Collins, San Jose, CA (US);

Hiroji Hanawa, Sunnyvale, CA (US);

Kartik Ramaswamy, Santa Clara, CA (US);

Andrew Nguyen, San Jose, CA (US);

Amir Al-bayati, San Jose, CA (US);

Biagio Gallo, Los Gatos, CA (US);

Gonzalo Antonio Monroy, San Francisco, CA (US);

Inventors:

Kenneth S. Collins, San Jose, CA (US);

Hiroji Hanawa, Sunnyvale, CA (US);

Kartik Ramaswamy, Santa Clara, CA (US);

Andrew Nguyen, San Jose, CA (US);

Amir Al-Bayati, San Jose, CA (US);

Biagio Gallo, Los Gatos, CA (US);

Gonzalo Antonio Monroy, San Francisco, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G23C 16/00 (2006.01); C23F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A plasma immersion ion implantation reactor for ion implanting a species into a surface layer of a workpiece includes an enclosure which has a side wall and a ceiling defining a chamber and a workpiece support pedestal within the chamber having a workpiece support surface facing the ceiling and defining a process region extending generally across the wafer support pedestal and confined laterally by the side wall and axially between the workpiece support pedestal and the ceiling. The enclosure has at least a first pair of openings at generally opposite sides of the process region and a first hollow conduit outside of the chamber having first and second ends connected to respective ones of the first pair of openings, so as to provide a first reentrant path extending through the conduit and across said process region. A gas distribution apparatus is provided on or near an interior surface of the reactor for introducing a process gas containing the species to be ion implanted and a first RE plasma source power applicator for generating a plasma in the chamber.


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