The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7107572 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 12, 2006

Filed:

Aug. 04, 2004
Applicants:

H. Daniel Dulman, Boise, ID (US);

William A. Stanton, Boise, ID (US);

John R. C. Futrell, Boise, ID (US);

Inventors:

H. Daniel Dulman, Boise, ID (US);

William A. Stanton, Boise, ID (US);

John R. C. Futrell, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G03F 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention includes methods of forming patterned reticles. Design features can be introduced into a layout for a reticle prior to optical proximity correction, and then removed prior to taping a pattern onto the reticle. Design features can alternatively, or additionally, be introduced after optical proximity correction and asymmetrically relative to one or more parts of a reticle pattern. The introduced features can subsequently be taped to the reticle as part of the formation of the patterned reticle.


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