The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2006

Filed:

Nov. 18, 2002
Applicants:

Richard A. Conti, Katonah, NY (US);

Daniel C. Edelstein, White Plains, NY (US);

Gill Yong Lee, Wappingers Falls, NY (US);

Inventors:

Richard A. Conti, Katonah, NY (US);

Daniel C. Edelstein, White Plains, NY (US);

Gill Yong Lee, Wappingers Falls, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/469 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is described for forming a low-k dielectric film, in particular, a pre-metal dielectric (PMD) on a semiconductor wafer which has good gap-filling characteristics. The method uses a thermal sub-atmospheric CVD process that includes a carbon-containing organometallic precusor such as TMCTS or OMCTS, an ozone-containing gas, and a source of dopants for gettering alkali elements and for lowering the reflow temperature of the dielectric while attaining the desired low-k and gap-filling properties of the dielectric film. Phosphorous is a preferred dopant for gettering alkali elements such as sodium. Additional dopants for lowering the reflow temperature include, but are not limited to boron, germanium, arsenic, fluorine or combinations thereof.

Published as:
US2003032306A1; DE10236430A1; WO03019619A2; AU2002323112A1; US6531412B2; US2003068853A1; WO03019619A3; KR20040019031A; CN1541403A; JP2005501406A; TW200514163A; TWI234204B; TWI234200B; KR100579017B1; US7084079B2; CN1280875C; JP4009250B2; MY134065A;

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