The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Feb. 15, 2001
Atsushi Shimoda, Hiratsuka, JP;
Ichirou Ishimaru, Mure, JP;
Yuji Takagi, Kamakura, JP;
Takuo Tamura, Yokohama, JP;
Yuichi Hamamura, Yokohama, JP;
Kenji Watanabe, Oume, JP;
Yasuhiko Ozawa, Abiko, JP;
Seiji Isogai, Hitachinaka, JP;
Atsushi Shimoda, Hiratsuka, JP;
Ichirou Ishimaru, Mure, JP;
Yuji Takagi, Kamakura, JP;
Takuo Tamura, Yokohama, JP;
Yuichi Hamamura, Yokohama, JP;
Kenji Watanabe, Oume, JP;
Yasuhiko Ozawa, Abiko, JP;
Seiji Isogai, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In order to allow critical flaws in an inspected item to be determined early during a production process, the present invention includes the following steps: a step of detecting defects in a production process for the inspected item and storing defect positions; a step of collecting detailed defect information and storing the detailed information in association with defect positions; a step of storing positions at which flaws were generated based on a final inspection of the inspected item; a step of comparing defect positions with positions at which flaws were generated; and a step of classifying and displaying detailed information based on the comparison results.