The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2005
Filed:
Sep. 29, 2000
Sharad Saxena, Richardson, TX (US);
Carlo Guardiani, San Jose, CA (US);
Philip D. Schumaker, Austin, TX (US);
Patrick D. Mcnamara, San Jose, CA (US);
Dale Coder, Sunnyvale, CA (US);
Sharad Saxena, Richardson, TX (US);
Carlo Guardiani, San Jose, CA (US);
Philip D. Schumaker, Austin, TX (US);
Patrick D. McNamara, San Jose, CA (US);
Dale Coder, Sunnyvale, CA (US);
PDF Solutions, Inc., San Jose, CA (US);
Abstract
A computer implemented method for statistical modeling and simulation of the impact of global variation and local mismatch on the performance of integrated circuits, comprises the steps of: estimating a representation of component mismatch from device performance measurements in a form suitable for circuit simulation; reducing the complexity of statistical simulation by performing a first level principal component or principal factor decomposition of global variation, including screening; further reducing the complexity of statistical simulation by performing a second level principal component decomposition including screening for each factor retained in the first level principal component decomposition step to represent local mismatch; and performing statistical simulation with the joint representation of global variation and local mismatch obtained in the second level principal component decomposition step.