The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

Apr. 28, 2004
Applicants:

Harry Sewell, Ridgefield, CT (US);

Jorge Ivaldi, Trumbull, CT (US);

John Shamaly, Shelton, CT (US);

Inventors:

Harry Sewell, Ridgefield, CT (US);

Jorge Ivaldi, Trumbull, CT (US);

John Shamaly, Shelton, CT (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B027/42 ; G02B027/58 ; G02B009/00 ;
U.S. Cl.
CPC ...
Abstract

The present invention relates to a lithography apparatus and method using catadioptric exposure optics that projects high quality images without image flip. The apparatus includes means for illuminating a reticle stage to produce a patterned image. The apparatus also includes means for receiving the patterned image at each of a plurality of wafer stages. Each of the wafer stages has an associated data collection station. The apparatus also includes means for positioning the reticle stage substantially orthogonal to each of the plurality of wafer stages as well as means for directing the patterned image through a catadioptric exposure optics element between the reticle stage and each wafer stage to cause an even number of reflections of the patterned image and to project the patterned image onto each wafer stage in a congruent manner. The invention can also be combined with a dual isolation system.


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