The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2005

Filed:

Jan. 21, 2004
Applicants:

Zhengquan Tan, Cupertino, CA (US);

Dongqing LI, Santa Clara, CA (US);

Walter Zygmunt, San Jose, CA (US);

Inventors:

Zhengquan Tan, Cupertino, CA (US);

Dongqing Li, Santa Clara, CA (US);

Walter Zygmunt, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/31 ; H01L021/469 ;
U.S. Cl.
CPC ...
Abstract

A method for forming a silicon oxide layer over a substrate disposed in a high density plasma substrate processing chamber. The method includes flowing a process gas that includes a silicon-containing source, an oxygen-containing source and a fluorine-containing source into the substrate processing chamber and forming a plasma from said process gas. The substrate is heated to a temperature above 450° C. during deposition of said silicon oxide layer and the deposited layer has a fluorine content of less than 1.0 atomic percent.


Find Patent Forward Citations

Tan, Zhengquan. (2005). Hdp-cvd deposition process for filling high aspect ratio gaps (U.S. Patent No. 6914016). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6914016

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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