The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2005

Filed:

Jul. 31, 2000
Applicants:

Chie-chi Chen, Kaohsiung, TW;

Wen-hsiang Tseng, Hsinchui, TW;

Sheng-liang Pan, Hsin-Chu, TW;

Jen-shiang Fang, Hsin-Chu, TW;

Inventors:

Chie-Chi Chen, Kaohsiung, TW;

Wen-Hsiang Tseng, Hsinchui, TW;

Sheng-Liang Pan, Hsin-Chu, TW;

Jen-Shiang Fang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B005/00 ;
U.S. Cl.
CPC ...
Abstract

Provided is a process and apparatus characterized by a gas distribution plate in which a gas supply manifold directs gas bubbles from the bottom of a process tank upward and between wafers contained in a cassette and supported therewithin. This improved method and apparatus is used for effectively stripping photoresist from the larger semiconductor wafers having dense top conductive patterns with protuberant sidewalls. The method provides a scrubbing action that is parallel to the device array being formed on the wafer's surface. Broadly stated, the method of a chemical action on large substrates supported adjacent respective edge portions thereof in a carrier includes submerging the carrier and substrates supported thereby in a process tank containing a liquid chemical, and a gas distribution plate disposed on the bottom of the tank for directing gas bubbles upward and parallel to the surfaces of each substrate contained in the carrier to ensure that a uniform chemical action occurs.


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