The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
Apr. 27, 1998
Mehrdad M. Moslehi, Los Altos, CA (US);
Cecil J. Davis, Greenville, TX (US);
Christopher J. Mann, Danville, CA (US);
Dwain R. Jakubik, Palmer, TX (US);
Ajit P. Paranjpe, Sunnyvale, CA (US);
Mehrdad M. Moslehi, Los Altos, CA (US);
Cecil J. Davis, Greenville, TX (US);
Christopher J. Mann, Danville, CA (US);
Dwain R. Jakubik, Palmer, TX (US);
Ajit P. Paranjpe, Sunnyvale, CA (US);
CVC Products, Inc., Rochester, NY (US);
Abstract
An apparatus and method for depositing plural layers of materials on a substrate within a single vacuum chamber allows high-throughput deposition of structures such as these for GMR and MRAM application. An indexing mechanism aligns a substrate with each of plural targets according to the sequence of the layers in the structure. Each target deposits material using a static physical-vapor deposition technique. A shutter can be interposed between a target and a substrate to block the deposition process for improved deposition control. The shutter can also preclean a target or the substrate and can also be used for mechanical chopping of the deposition process. In alternative embodiments, plural substrates may be aligned sequentially with plural targets to allow simultaneous deposition of plural structures within the single vacuum chamber. A monitoring and control device can be wed to optimize equipment state, process state, and wafer state parameters by sensing each respective state during or after the deposition process.