The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Oct. 02, 1998
Applicants:
Brian Samuel Beaman, Apex, NC (US);
Keith Edward Fogel, Mohegan Lake, NY (US);
Paul Alfred Lauro, Nanuet, NY (US);
Eugene John O'sullivan, Nyack, NY (US);
Da-yuan Shih, Poughkeepsie, NY (US);
Ho-ming Tong, Taipei, TW;
Inventors:
Brian Samuel Beaman, Apex, NC (US);
Keith Edward Fogel, Mohegan Lake, NY (US);
Paul Alfred Lauro, Nanuet, NY (US);
Eugene John O'Sullivan, Nyack, NY (US);
Da-Yuan Shih, Poughkeepsie, NY (US);
Ho-Ming Tong, Taipei, TW;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/02 ;
U.S. Cl.
CPC ...
Abstract
A plated test probe structure for testing electrical connections to integrated circuits (IC) devices with solder bumped interconnection pads that are an integral part of the fan-out wiring on the test substrate, or other printed wiring device.