The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2005

Filed:

Sep. 05, 2001
Applicants:

Junichi Tanaka, Tsuchiura, JP;

Hiroyuki Kitsunai, Chiyoda, JP;

Hideyuki Yamamoto, Kudamatsu, JP;

Shoji Ikuhara, Hikari, JP;

Kazue Takahashi, Kudamatsu, JP;

Inventors:

Junichi Tanaka, Tsuchiura, JP;

Hiroyuki Kitsunai, Chiyoda, JP;

Hideyuki Yamamoto, Kudamatsu, JP;

Shoji Ikuhara, Hikari, JP;

Kazue Takahashi, Kudamatsu, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F019/00 ;
U.S. Cl.
CPC ...
Abstract

A monitor data acquisition section acquires a plurality of monitor data relating to a processing state of one sample in a processing apparatus, via sensors. A data selection section selects monitor data belonging to an arbitrary processing division included in a plurality of processing divisions for the sample, from among the plurality of monitor data. A monitoring signal generation section generates monitoring signals based on the monitor data belonging to the arbitrary processing division selected by the data selection section. A display setting controller displays a plurality of monitoring signals obtained with respect to samples processed in the processing apparatus, on a display section in a time series manner.


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