The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2005
Filed:
Jul. 18, 2003
Hiroshi Kakibayashi, Nagareyama, JP;
Shigeyuki Hosoki, Hachioji, JP;
Yuji Takagi, Kamakura, JP;
Ryo Miyake, Tsukuba, JP;
Kuniyasu Nakamura, Musahino, JP;
Mitsugu Sato, Hitachinaka, JP;
Hiroyuki Kobayashi, Mito, JP;
Hiroshi Kakibayashi, Nagareyama, JP;
Shigeyuki Hosoki, Hachioji, JP;
Yuji Takagi, Kamakura, JP;
Ryo Miyake, Tsukuba, JP;
Kuniyasu Nakamura, Musahino, JP;
Mitsugu Sato, Hitachinaka, JP;
Hiroyuki Kobayashi, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A bio electron microscope and an observation method which can observe a bio specimen by low damage and high contrast to perform high-accuracy image analysis, and conduct high-throughput specimen preparation. 1) A specimen is observed at an accelerating voltage 1.2 to 4.2 times a critical electron accelerating voltage possible to transmit a specimen obtained under predetermined conditions. 2) An electron energy filter of small and simplified construction is provided between the specimen and an electron detector for imaging by the electron beam in a specified energy region of the electron beams transmitting the specimen. 3) Similarity between an observed image such as virus or protein in the specimen and a reference image such as known virus or protein is subjected to quantitative analysis by image processing. 4) A preparation protocol of the bio specimen is made into a chip using an MEMS technique, which is then mounted on a specimen stage part of an electron microscope to conduct specimen introduction, preparation and transfer onto a specimen holder.