The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6825684 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 30, 2004

Filed:

Jun. 10, 2002
Applicant:
Inventors:

Hyeon-Seag Kim, San Jose, CA (US);

Amit P. Marathe, Milpitas, CA (US);

Nian Yang, San Jose, CA (US);

Tien-Chun Yang, San Jose, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/100 ;
U.S. Cl.
CPC ...
G01R 3/100 ;
Abstract

A method of generating a lifetime projection for semiconductor devices is disclosed. The disclosed method includes collecting lifetime information from a plurality of semiconductor devices at more than one stress condition. The method also includes determining the median lifetime for semiconductor devices at each of the stress conditions. Further, the method includes calculating a lifetime at each stress condition at which a predetermined percentage of the devices will exceed and extrapolating the lifetime for devices used at operating conditions.


Find Patent Forward Citations

Kim, Hyeon-Seag. (2004). Hot carrier oxide qualification method (U.S. Patent No. 6825684). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6825684

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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