The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6679950 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 20, 2004

Filed:

Jun. 28, 2001
Applicant:
Inventors:

Hiroshi Tomita, Kanagawa, JP;

Motoyuki Sato, Kanagawa, JP;

Soichi Nadahara, Kanagawa, JP;

Mitsuhiko Shirakashi, Kanagawa, JP;

Kenya Ito, Kanagawa, JP;

Assignee:

Ebara Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 3/00 ;
U.S. Cl.
CPC ...
B08B 3/00 ;
Abstract

A substrate cleaning method of the present invention enables effective cleaning of a wafer having a recess therein without causing any increase in cleaning costs. Ozone gas and ammonia water are supplied to an area right above a wafer having a recess therein, and a gas-dissolving liquid is produced by dissolving the ozone gas in the ammonia water. The gas-dissolving liquid is used to carry out contact and non-contact types of physical cleaning on the wafer.


Find Patent Forward Citations

Tomita, Hiroshi. (2004). Cleaning method and cleaner (U.S. Patent No. 6679950). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6679950

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…