The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2003

Filed:

Feb. 01, 2002
Applicant:
Inventors:

Victor Seng-Keong Lim, Singapore, SG;

Chen Feng, Singapore, SG;

Subramanian Balakumar, Singapore, SG;

Paul Proctor, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 5/08 ;
U.S. Cl.
CPC ...
B24B 5/08 ;
Abstract

An improved chemical mechanical polishing apparatus for planarizing semiconductor surface materials. The single rotating polishing platen with an attached pad of conventional CMP processes is replaced with two controlled independently driven, concentric and coplanar, polishing platens. The two co-planar polishing platens allows for separate adjustable options to the CMP polishing process. The options are provided by having pads of different material compositions and hardness. Moreover, an annular space is provided between the platens to introduce the usage of two slurry formulations, one to each pad, on the same CMP tool. The annular space between platens forming a drain path for catching and containing slurry waste.


Find Patent Forward Citations

Loading…