The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2003

Filed:

Jan. 16, 2002
Applicant:
Inventors:

Sun-Chieh Chien, Hsinchu, TW;

Chien-Li Kuo, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/122 ;
U.S. Cl.
CPC ...
H01L 2/122 ;
Abstract

A method of fabricating a system on a chip device. On a substrate having a memory cell region and a peripheral circuit region a gate oxide layer and a polysilicon layer are formed. The peripheral circuit region can further be divided into a logic device region and a hybrid circuit region. A dielectric layer is formed on the peripheral circuit region. A cap layer and a conductive layer are further formed on the polysilicon layer in the memory cell region and on the dielectric layer in the peripheral circuit region. Using the dielectric layer in the peripheral circuit region and the gate oxide layer in the memory cell region as etch stop, the cap layer and the conductive layer in the peripheral circuit region, and the cap layer, the conductive layer and the polysilicon layer are patterned. As a result, at least a gate and a top electrode are formed in the memory cell region and the hybrid circuit region, respectively. Using the gate oxide layer in the peripheral circuit region as an etch stop, the dielectric layer and the conductive layer in the peripheral circuit region are patterned to form a gate in the logic circuit region and the hybrid circuit region, respectively.


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