The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2002

Filed:

Aug. 01, 2000
Applicant:
Inventors:

Chu-Wei Hu, Hsin-Chu, TW;

Chung-Te Lin, Tainan, TW;

Kuo-Hua Pan, Taichung, TW;

Hsien-Chin Lin, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1326 ; H01L 2/182 ; H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/1326 ; H01L 2/182 ; H01L 2/144 ;
Abstract

A method of forming aluminum guard structures in copper interconnect structures, used to protect the copper interconnect structures from a laser write procedure, performed to an adjacent copper fuse element, has been developed. The method features forming guard structure openings in an upper level of the copper interconnect structures, in a region adjacent to a copper fuse element. Deposition and patterning of an aluminum layer result in the formation of aluminum guard structures, located in the guard structure openings. The aluminum guard structures protect the copper interconnect structures from the oxidizing and corrosive effects of oxygen, fluorine and water ions, which are generated during a laser write procedure, performed to the adjacent copper fuse element.


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