The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Mar. 25, 1997
Applicant:
Inventors:

Peter Wung Lee, Saratoga, CA (US);

Hsing-Ya Tsao, Taipei, TW;

Fu-Chang Hsu, Taipei, TW;

Wen-Tan Fan, Taipei, TW;

Assignee:

Aplus Flash Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/216 ;
U.S. Cl.
CPC ...
G06F 1/216 ;
Abstract

A flash memory having over-erased cells eliminated and comprising adjustable erase and program conditions. The maximum and minimum threshold voltages of the cells are measured during the whole erase and program operations. The over-erased cells are shut down by applying a word line voltage lower than the minimum threshold voltage measured previously. Pre-program and repair operations for the over-erased cell are eliminated. Low read voltage is achieved. The erase and program conditions for the gate, source, drain voltage, width of a pulse, and number of pulses are adjustable in accordance with the threshold voltage to optimize the performance. A lookup table stores the relevant gate, source, drain voltage, width of a pulse, and number of pulses with respect to the threshold voltage for the adjustable conditions. The benefits achieved by the operation of the flash memory include high efficiency, long endurance, narrow threshold voltage distribution, low power consumption, and low process-sensitivity.


Find Patent Forward Citations

Loading…