The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2001

Filed:

Dec. 23, 1998
Applicant:
Inventors:

Tse-Yu Yeh, Milpitas, CA (US);

Gregory Mathews, Santa Clara, CA (US);

Steven Tu, Phoenix, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/38 ;
U.S. Cl.
CPC ...
G06F 9/38 ;
Abstract

A decentralized exception processing system includes a plurality of local exception units. Each local exception unit is coupled to process local exception signals from one or more processing resources that are proximate to it. Each local exception unit generates local commit signals, using order information for the instruction in an issue group and any local exception signals it receives. The local commit signals are combined to generate a global commit signal for each instruction in the issue group. Local exception signals are collected at a selected one of the local exception units and processed to generate a global exception unit. The selected local exception unit resteers control of the processing resources to an exception handler associated with the global exception unit.


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