The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2001

Filed:

Mar. 05, 1999
Applicant:
Inventors:

Shwangming Jeng, Hsin-Chu, TW;

Chen-Hua Yu, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/144 ;
Abstract

A method for forming a metal silicide layer. There is first provided a substrate. There is then formed over the substrate a silicon layer, where the silicon layer has other than an amorphous silicon surface. There is then annealed thermally the silicon layer at a temperature greater than a silicidation temperature for forming a metal silicide layer upon the silicon layer to thus form from the silicon layer a thermally annealed silicon layer. Finally, there is then deposited upon the thermally annealed silicon layer a metal silicide forming metal while employing a metal deposition method such that upon contact with the thermally annealed silicon layer the metal silicide forming metal reacts in-situ to form a metal silicide layer upon a partially consumed thermally annealed silicon layer formed from the thermally annealed silicon layer.


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