The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2001

Filed:

Mar. 29, 1999
Applicant:
Inventors:

Chun-Liang Liu, Hsinchu, TW;

Hsien-Liang Meng, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1762 ;
U.S. Cl.
CPC ...
H01L 2/1762 ;
Abstract

A method of fabricating a shallow trench isolation structure is described. A mask layer is formed on a substrate. The mask layer and the substrate are patterned to form a trench in the substrate. A first deposition step and a second deposition step are performed to form a first isolation layer over the substrate. A third deposition step is performed to form a second isolation layer on the first isolation layer. The second isolation layer has a greater fluidity than the first isolation layer has. A planarization process is performed with the mask layer serving as a stop layer. A portion of the first isolation layer and the mask layer are removed to form the shallow trench isolation structure.


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