The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2000

Filed:

Oct. 27, 1997
Applicant:
Inventors:

Tony Lin, Kao Hsiung Hsien, TW;

Heng-Sheng Huang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
438761 ; 438303 ; 438305 ; 438696 ;
Abstract

A method for manufacturing spacers comprising the steps of first providing a semiconductor substrate having a gate electrode already formed thereon, and then sequentially depositing oxide, silicon nitride and oxide over the gate electrode and the substrate to form a first oxide layer, a silicon nitride layer and a second oxide layer. Subsequently, the second oxide layer is etched to form an oxide spacer above the silicon nitride layer. Thereafter, using the oxide spacer as a mask, a dry etching method having a high etching selectivity ratio for silicon nitride/oxide is used to etch the silicon nitride layer to form a silicon nitride spacer. Finally, the oxide spacer is removed using an oxide dip method. The silicon nitride spacers of this invention can have a greater thickness, more thickness uniformity, and a higher reliability for hot carriers. In addition, the method used in the invention can have a better control over the thickness.


Find Patent Forward Citations

Lin, Tony. (2000). Manufacturing method for spacer (U.S. Patent No. 6165913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6165913

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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