The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2000
Filed:
May. 22, 1998
Applicant:
Inventors:
Shaulin Shue, Hsinchu, TW;
Mei-Yun Wang, Hsinchu, TW;
Assignee:
Taiwan Semiconductor Manufacturing Company, Hsin-Chu, TW;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438680 ; 438624 ; 438627 ; 438637 ; 438648 ; 438643 ; 438685 ;
Abstract
Methods are disclosed to provide a low-cost method of producing a refractory liner in submicron vias or trenches applying ionized metal plasma using physical vapor deposition (PVD). The refractory liner is deposited on the bottom and sidewalls of the submicron vias and trenches in a two step PVD, using first high pressure and then low pressure. By selecting adhesion layer and diffusion barrier materials such as tantalum, tantalum nitride or titanium nitride or alloys of these metals a uniform barrier is created which forms a suitable layer around copper metallization.