The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2000

Filed:

Jan. 07, 1999
Applicant:
Inventors:

Alan J Jensen, Troutdale, OR (US);

Norman A Mertke, Morgan Hill, CA (US);

William Dyson, Jr, San Jose, CA (US);

Lynn Ryle, San Jose, CA (US);

Patrick Paino, Otisville, NY (US);

Assignee:

OnTrak Systems, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B / ; B08B / ; B08B / ;
U.S. Cl.
CPC ...
134-6 ; 134-9 ; 134 32 ; 134 33 ; 134902 ; 15 77 ; 15 881 ; 15 882 ; 15 883 ;
Abstract

A method for rotating wafers in a double sided scrubber where a rotating roller imparts rotary motion to a semiconductor wafer during a double sided cleaning process. The rotating roller and wafer contact at their outer edges and the friction between their outer edges causes the wafer to rotate. The roller has an outer edge with a groove in which the wafer edge is pinched. Treads or grooves extending from the groove channel liquids away from the groove to prevent wafer slippage when rotating and cleaning solutions are applied to the wafer.


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