The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1999
Filed:
Mar. 31, 1997
Applicant:
Inventors:
David Wu, Beaverton, OR (US);
Praveen Parvathala, Phoenix, AZ (US);
Naga Gollakota, Folsom, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
714726 ; 714728 ;
Abstract
A method and apparatus for using weighted random patterns in a partial scan test. A computer generates deterministic patterns on the partial scan design. Deterministic patterns that have the same number of capture clocks between adjacent scan loads are grouped together into pattern groups. A computer then determines a set of weights corresponding to each of the pattern groups. A tester then uses these weights as a filter to weighted random test patterns and applies these filtered weighted random test patterns along with the appropriate number of capture clock pulses to a device under test.