The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1998

Filed:

Jul. 12, 1996
Applicant:
Inventors:

Jun Zhao, Cupertino, CA (US);

Ashok Sinha, Palo Alto, CA (US);

Avi Tepman, Cupertino, CA (US);

Mei Chang, Saratoga, CA (US);

Lee Luo, Fremont, CA (US);

Alex Schreiber, Santa Clara, CA (US);

Talex Sajoto, Campbell, CA (US);

Stefan Wolff, Sunnyvale, CA (US);

Charles Dornfest, Fremont, CA (US);

Michal Danek, Cupertino, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C / ;
U.S. Cl.
CPC ...
118728 ; 118725 ; 1187 / ; 118500 ;
Abstract

A substrate processing chamber, particularly a chemical vapor deposition (CVD) chamber used both for thermal deposition of a conductive material and a subsequently performed plasma process. The invention reduces thermal deposition of the conductive material on peripheral portions of the pedestal supporting a wafer and in a pumping channel exhausting the chamber. A peripheral ring placed on the pedestal, preferably also used to center the wafer, is thermally isolated from the pedestal so that its temperature is kept substantially lower than that of the wafer. Despite its thermal isolation, the peripheral ring is electrically connected to the pedestal to prevent arcing. The pumping channel is lined with various elements, some of which are electrically floating and which are designed so that conductive material deposited on these elements do not deleteriously affect a plasma generated for processing the wafer.

Published as:
EP0818558A1; JPH1070088A; KR980009511A; US5846332A; TW359853B; US5964947A; US2001004478A1; US6270859B2; EP1172458A2; EP0818558B1; DE69710961D1; EP1172458A3; DE69710961T2; KR100522903B1;

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