The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1998

Filed:

Mar. 06, 1996
Applicant:
Inventors:

Fwu-Iuan Hshieh, Saratoga, CA (US);

Lih-Ying Ching, Cupertino, CA (US);

Hoang Tran, San Jose, CA (US);

Mike F Chang, Cupertino, CA (US);

Assignee:

Siliconix incorporated, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257330 ;
Abstract

A trenched DMOS transistor has significantly reduced on-resistance. A lightly doped P tub is formed surrounding the P+ body region in order to enhance avalanche breakdown. Thus the epitaxial layer resistivity can be decreased to reduce device on-resistance, while the desired breakdown voltage is also achieved. The on-resistance is further reduced by adding a pre-initial oxidation implant, i.e. phosphorous for an N channel device or boron for a P channel device. This forms a more heavily doped JFET or pinch region at the bottom of the trench and in the upper portion of the drift region. This N JFET region (which is P doped for a P channel device) is more heavily doped than the underlying epitaxial layer and surrounds the trench bottom, thus reducing on-resistance by increasing local doping concentration where otherwise a parasitic JFET would be present.


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