The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1987

Filed:

Oct. 28, 1986
Applicant:
Inventors:

Nicholas J Giammarco, Newburgh, NY (US);

Alexander Gimpelson, Allston, MA (US);

George A Kaplita, New Windsor, NY (US);

Alexander D Lopata, Fishkill, NY (US);

Anthony F Scaduto, Newburgh, NY (US);

Joseph F Shepard, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; B44C / ; C03C / ; C03C / ;
U.S. Cl.
CPC ...
156643 ; 156644 ; 156646 ; 156648 ; 156657 ; 1566591 ; 1566611 ; 156662 ; 156653 ; 427 431 ; 428137 ; 430-5 ; 430313 ;
Abstract

Disclosed is a process for reducing lithographic image size for integrated circuit manufacture. A mask of photosensitive material having an opening of a minimum size dictated by the limits of lithography is formed on a substrate. Reduction in the image size is achieved by establishing sidewalls to the interior vertical surfaces of the opening by depositing a conformal layer, followed by anisotropic etching. The dimension of the opening is reduced by the combined thickness of the two opposite insulator sidewalls. In a specific direct application of the disclosed process, a photomask/stencil having a pattern of openings of a minimum size smaller than possible by lithography, per se, is formed.


Find Patent Forward Citations

Loading…