The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jun. 21, 2021
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventors:

Nick Ray Linebarger, Jr., Beaverton, OR (US);

Fayaz A. Shaikh, Lake Oswego, OR (US);

Arul N. Dhas, Sherwood, OR (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 16/455 (2006.01); C23C 16/458 (2006.01); C23C 16/509 (2006.01); H10P 14/60 (2026.01);
U.S. Cl.
CPC ...
H01J 37/32715 (2013.01); C23C 16/45565 (2013.01); C23C 16/45597 (2013.01); C23C 16/4585 (2013.01); C23C 16/5096 (2013.01); H01J 37/32403 (2013.01); H01J 37/32743 (2013.01); H01J 37/32788 (2013.01); H01J 37/32899 (2013.01); H10P 14/6336 (2026.01); H01J 2237/332 (2013.01);
Abstract

Multi-station processing tools with station-varying support features for backside processing are provided. The support features in a first station may hold a wafer at a first set of points during backside deposition, blocking backside deposition, etching, or other processing at those points. The support features in a second station may hold a wafer at a second set of points that don't overlap with the first set of points.


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Linebarger, Jr., Nick. (2026). Multi-station processing tools with station-varying support features for backside processing (U.S. Patent No. 12770839). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12770839

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