The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jan. 08, 2025
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Patrick R. Khayat, San Diego, CA (US);

Steven Michael Kientz, Westminster, CO (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Mustafa N. Kaynak, San Diego, CA (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/064 (2013.01); G06F 3/0625 (2013.01); G06F 3/0679 (2013.01);
Abstract

A processing device in a memory sub-system detects an occurrence of a triggering event, determines respective levels of charge loss associated with a first representative wordline of a block of a memory device and with a second representative wordline of the block of the memory device, and determines whether a difference between the respective levels of charge loss satisfies a threshold criterion. Responsive to determining that the difference between the respective levels of charge loss satisfies the threshold criterion, the processing device further determines that the block is in a uniform charge loss state.


Find Patent Forward Citations

Khayat, Patrick. (2026). Measurement of representative charge loss in a block to determine charge loss state (U.S. Patent No. 12769470). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12769470

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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