The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Sep. 20, 2023
Applicant:

United Microelectronics Corp., Hsin-Chu City, TW;

Inventors:

Chang-Yih Chen, Tainan City, TW;

Kuo-Hsing Lee, Hsinchu County, TW;

Chun-Hsien Lin, Tainan City, TW;

Kun-Szu Tseng, Tainan City, TW;

Sheng-Yuan Hsueh, Tainan City, TW;

Yao-Jhan Wang, Tainan City, TW;

Assignee:

UNITED MICROELECTRONICS CORP., Hsin-Chu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); H10D 1/00 (2025.01); H10D 1/66 (2025.01); H10D 30/01 (2025.01); H10D 30/62 (2025.01); H10D 84/80 (2025.01);
U.S. Cl.
CPC ...
H10D 1/66 (2025.01); H10D 1/047 (2025.01); H10D 30/024 (2025.01); H10D 30/6211 (2025.01); H10D 84/811 (2025.01);
Abstract

A method for fabricating a semiconductor device includes the steps of first providing a substrate having a non-metal-oxide semiconductor capacitor (non-MOSCAP) region and a MOSCAP region, forming a fin-shaped structure on the MOSCAP region, forming a shallow trench isolation (STI) around the substrate and the fin-shaped structure, performing a first etching process to remove part of the STI on the MOSCAP region, and then performing a second etching process to remove part of the STI on the non-MOSCAP region and the MOSCAP region.


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