The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Oct. 04, 2022
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Jeremy Ecton, Gilbert, AZ (US);

Robert Alan May, Chandler, AZ (US);

Suddhasattwa Nad, Chandler, AZ (US);

Srinivas V. Pietambaram, Chandler, AZ (US);

Brandon C. Marin, Gilbert, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 3/06 (2006.01); H05K 1/09 (2006.01); H05K 1/181 (2026.01); H10W 70/05 (2026.01); H10W 70/652 (2026.01); H10W 70/66 (2026.01);
U.S. Cl.
CPC ...
H05K 3/062 (2013.01); H05K 1/09 (2013.01); H05K 3/067 (2013.01); H10W 70/05 (2026.01); H10W 70/652 (2026.01); H10W 70/66 (2026.01); H05K 1/181 (2013.01); H05K 2201/0338 (2013.01); H05K 2203/0789 (2013.01); H05K 2203/0793 (2013.01);
Abstract

Embodiments provides for a package substrate, including: a core comprising insulative material; first conductive traces in contact with a surface of the core; and buildup layers in contact with the first conductive traces and the surface of the core, the buildup layers comprising second conductive traces in an organic dielectric material. The first conductive traces comprise at least a first metal and a second metal, the first conductive traces comprise a first region proximate to and in contact with the core and a second region distant from the core, parallel and opposite to the first region, a relative concentration of the first metal to the second metal is higher in the first region than in the second region, and the relative concentration of the first metal to the second metal between the first region and the second region varies non-uniformly.


Find Patent Forward Citations

Loading…