The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jun. 13, 2024
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Li-Chi Yu, Jhubei, TW;

Cheng-I Chu, Hsinchu, TW;

Chen-Fong Tsai, Hsinchu, TW;

Yi-Rui Chen, Hsinchu, TW;

Sen-Hong Syue, Zhubei, TW;

Wen-Kai Lin, Yilan, TW;

Yoh-Rong Liu, Hsinchu, TW;

Huicheng Chang, Tainan, TW;

Yee-Chia Yeo, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10D 64/01 (2025.01); H10D 30/01 (2025.01); H10D 30/67 (2025.01); H10D 62/00 (2026.01); H10D 62/10 (2025.01); H10D 64/62 (2025.01); H10D 84/01 (2026.01); H10D 84/03 (2025.01); H10D 84/85 (2025.01); H10P 14/20 (2026.01); H10P 14/60 (2026.01); H10P 50/64 (2026.01);
U.S. Cl.
CPC ...
H10D 64/018 (2025.01); H10D 30/031 (2025.01); H10D 30/6713 (2025.01); H10D 30/6729 (2025.01); H10D 30/6735 (2025.01); H10D 30/6757 (2025.01); H10D 62/021 (2025.01); H10D 62/118 (2025.01); H10D 64/0112 (2026.01); H10D 64/017 (2025.01); H10D 64/62 (2025.01); H10D 84/0167 (2025.01); H10D 84/017 (2025.01); H10D 84/0172 (2025.01); H10D 84/0184 (2025.01); H10D 84/0186 (2025.01); H10D 84/038 (2025.01); H10D 84/85 (2025.01); H10P 14/3452 (2026.01); H10P 14/6308 (2026.01); H10P 50/642 (2026.01);
Abstract

Embodiments include nanostructure devices and methods of forming nanostructure devices which include a treatment process to expand a sidewall spacer material to close a seam in the sidewall spacer material after deposition. The treatment process includes oxidation anneal and heat anneal to expand the sidewall spacer material and crosslink the open seam to form a closed seam, lower k-value, and decrease density.


Find Patent Forward Citations

Loading…