The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Oct. 26, 2023
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Aykut Aydin, Sunnyvale, CA (US);

Rajesh Prasad, Lexington, MA (US);

Fenglin Wang, Lexington, MA (US);

Rui Cheng, San Jose, CA (US);

Karthik Janakiraman, San Jose, CA (US);

Kyu-Ha Shim, Andover, MA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 30/40 (2026.01); C23C 16/56 (2006.01); H10B 12/00 (2023.01); H10P 14/60 (2026.01); H10P 14/68 (2026.01); H10P 50/00 (2026.01); H10P 50/28 (2026.01); H10P 76/40 (2026.01);
U.S. Cl.
CPC ...
H10P 30/40 (2026.01); C23C 16/56 (2013.01); H10B 12/01 (2023.02); H10P 14/6518 (2026.01); H10P 14/68 (2026.01); H10P 50/282 (2026.01); H10P 50/73 (2026.01); H10P 76/405 (2026.01); H10P 76/4085 (2026.01);
Abstract

Thicker hardmasks are typically needed for etching deeper capacitor holes in a DRAM structure. Instead of increasing the hardmask thickness, hardmasks may instead be formed with an increased etch selectivity relative to the underlying semiconductor structure. For example, boron-based hardmasks may be formed that include a relatively high percentage of boron (e.g., greater than 90%). The etch selectivity of the hardmask may be improved by performing an ion implant process using different types of ions. The ion implant may take place before or after opening the hardmask with the pattern for the DRAM capacitor holes. Some designs may also tilt the semiconductor substrate relative to the ion implant process and rotate the substrate to provide greater ion penetration throughout a depth of the openings in the hardmask.


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