The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Apr. 27, 2023
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Mohamed Suleman Moosa, Austin, TX (US);

Gary Edwin Anderson, II, Austin, TX (US);

Mehul D. Shroff, Austin, TX (US);

George Walter Lange, Austin, TX (US);

Antoine Fabien Dubois, Austin, TX (US);

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/356 (2006.01); H03K 19/08 (2006.01); H03K 19/17784 (2020.01);
U.S. Cl.
CPC ...
H03K 19/0813 (2013.01); H03K 3/356 (2013.01); H03K 19/17784 (2013.01);
Abstract

A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value.


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