The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Mar. 16, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Kuen-Shian Chen, Hsin-Chu, TW;

Chien-Li Kuo, Hsinchu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10W 42/00 (2026.01); H10W 20/00 (2026.01); H10W 20/42 (2026.01); H10W 20/43 (2026.01); H10W 20/44 (2026.01); H10W 20/47 (2026.01); H10W 72/00 (2026.01); H10W 70/05 (2026.01); H10W 70/65 (2026.01); H10W 72/20 (2026.01); H10W 72/29 (2026.01); H10W 72/90 (2026.01); H10W 74/10 (2026.01);
U.S. Cl.
CPC ...
H10W 42/00 (2026.01); H10W 20/0698 (2026.01); H10W 20/42 (2026.01); H10W 20/43 (2026.01); H10W 20/4405 (2026.01); H10W 20/4421 (2026.01); H10W 20/4432 (2026.01); H10W 20/47 (2026.01); H10W 72/019 (2026.01); H10W 70/05 (2026.01); H10W 70/65 (2026.01); H10W 72/242 (2026.01); H10W 72/29 (2026.01); H10W 72/942 (2026.01); H10W 74/129 (2026.01);
Abstract

Structures and methods for reducing thermal expansion mismatch during chip scale packaging are disclosed. In one example, a semiconductor structure is disclosed. The semiconductor structure includes a first metal layer over a substrate, a dielectric region, and a polymer region. The first metal layer comprises a first device metal structure. The dielectric region is formed over the first metal layer. The polymer region is formed over the dielectric region. The dielectric region comprises a plurality of metal layers and an inter-metal dielectric layer comprising dielectric material between each pair of two adjacent metal layers in the plurality of metal layers. Each of the plurality of metal layers comprises a dummy metal structure over the first device metal structure. The dummy metal structures in each pair of two adjacent metal layers in the plurality of metal layers shield respectively two non-overlapping portions of the first device metal structure from a top view of the semiconductor structure.


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