The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jul. 26, 2022
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Chun-Yuan Chen, HsinChu, TW;

Chia-Hao Chang, Hsinchu City, TW;

Cheng-Chi Chuang, New Taipei City, TW;

Yu-Ming Lin, Hsinchu City, TW;

Chih-Hao Wang, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10W 20/40 (2026.01); H10D 30/01 (2025.01); H10D 30/62 (2025.01); H10D 64/01 (2025.01); H10P 14/40 (2026.01); H10P 14/46 (2026.01); H10P 52/40 (2026.01); H10W 10/00 (2026.01); H10W 10/17 (2026.01); H10W 20/00 (2026.01); H10W 20/41 (2026.01); H10W 20/43 (2026.01);
U.S. Cl.
CPC ...
H10W 20/498 (2026.01); H10D 30/024 (2025.01); H10D 30/6211 (2025.01); H10D 64/017 (2025.01); H10P 14/418 (2026.01); H10P 14/46 (2026.01); H10P 52/403 (2026.01); H10W 10/014 (2026.01); H10W 10/17 (2026.01); H10W 20/035 (2026.01); H10W 20/057 (2026.01); H10W 20/062 (2026.01); H10W 20/081 (2026.01); H10W 20/425 (2026.01); H10W 20/43 (2026.01);
Abstract

The present disclosure provides a method of forming a semiconductor device structure. The method includes forming a trench in a dielectric layer on a semiconductor substrate; forming a bottom metal feature of a first metal in a lower portion of the trench by a selective deposition; depositing a barrier layer in an upper portion of the trench, the barrier layer directly contacting both a top surface of the bottom metal feature and sidewalls of the dielectric layer; and forming a top metal feature of a second metal on the barrier layer, filling in the upper portion of the trench, wherein the second metal is different from the first metal in composition.


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