The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Oct. 09, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mustafa N. Kaynak, San Diego, CA (US);

Mariano Burich, San Diego, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Eyal En Gad, Freemont, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/106 (2013.01); G06F 11/1004 (2013.01);
Abstract

A method for decoding data includes determining that a codeword received from a memory device has errors and assigning responsive to the determining, a reliability value to bits of the codeword for a low-density parity check (LDPC) code. The LDPC code employs an irregular H matrix to decode data. The method includes iteratively executing decoding operations until a termination condition is met. The decoding operations include determining whether to skip a reliability update for a selected bit in the codeword based on a collated skipping pattern, a column weight of the selected bit and an iteration count of the decoding operations and omitting updating of the reliability value responsive to the selected bit being skipped. The decoding operations include determining whether each parity check defined in the LDPC code is satisfied. The method further includes outputting a corrected codeword based on final reliability values for bits in the codeword.


Find Patent Forward Citations

Kaynak, Mustafa. (2026). Selective reliability update for error decoding (U.S. Patent No. 12705134). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12705134

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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