The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Feb. 13, 2023
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;
Wei-Xiang You, Hsinchu, TW;
Wei-De Ho, Hsinchu, TW;
Hsin Yang Hung, Hsinchu, TW;
Meng-Yu Lin, Hsinchu, TW;
Hsiang-Hung Huang, Hsinchu, TW;
Chun-Fu Cheng, Hsinchu, TW;
Kuan-Kan Hu, Hsinchu, TW;
Szu-Hua Chen, Hsinchu, TW;
Ting-Yun Wu, Hsinchu, TW;
Wei-Cheng Tzeng, Hsinchu, TW;
Wei-Cheng Lin, Hsinchu, TW;
Cheng-Yin Wang, Hsinchu, TW;
Jui-Chien Huang, Hsinchu, TW;
Szuya Liao, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;
Abstract
A device includes: a complementary transistor including: a first transistor having first and second source/drain regions; and a second transistor stacked on the first transistor, and having a third source/drain region and a fourth source/drain region, the third source/drain region overlapping the first source/drain region, the fourth source/drain region overlapping the second source/drain region. The device further includes: a first source/drain contact electrically coupled to the third source/drain region; a second source/drain contact electrically coupled to the second source/drain region; a gate isolation structure adjacent the first and second transistors; and an interconnect structure electrically coupled to the first source/drain contact and the second source/drain contact. The interconnect structure includes: a conductive layer in contact with the first source/drain contact and the second source/drain contact, the conductive layer being in the gate isolation structure; an opening in the conductive layer; and a dielectric layer in the opening.