The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jul. 24, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mustafa N. Kaynak, San Diego, CA (US);

Mariano Burich, San Diego, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Eyal En Gad, Fremont, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1125 (2013.01);
Abstract

An error-handling module of a controller determines that a codeword received from a memory device has errors. The error-handing module assigs an initial set of log-likelihood ratios (LLRs) to bits of the codeword based on a column weight (CW) of a low density parity check (LDPC) code. The error-handling module updates the LLRs based on parity check outcomes. The controller decodes embedded data from the codeword based on the updated LLRs.


Find Patent Forward Citations

Kaynak, Mustafa. (2026). Error decoding with iterative parameter updating (U.S. Patent No. 12683630). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12683630

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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