The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Jul. 17, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Zixiang Loh, San Jose, CA (US);

Steven Michael Kientz, Westminster, CO (US);

Patrick R. Khayat, San Diego, CA (US);

Shantilal Doru, San Diego, CA (US);

Jun Wan, San Jose, CA (US);

Ying Yu Tai, Mountain View, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/52 (2006.01); G06F 11/07 (2006.01); G06F 11/10 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/52 (2013.01); G06F 11/076 (2013.01); G06F 11/1048 (2013.01); G06F 11/1068 (2013.01); G11C 16/26 (2013.01);
Abstract

The present disclosure configures a system component, such as memory sub-system controller, to determine read thresholds for memory blocks. The controller selects a group of memory blocks stored in a set of memory components and determines that the group of memory blocks is associated with a current bin of a plurality of bins, each bin of the plurality of bins comprising a respective plurality of read threshold offsets. The controller samples data stored in the group of memory blocks across different page types using the current bin and, in response to sampling the data, associates the different page types of the group of memory blocks with respective pointers to different bins of the plurality of bins for subsequently reading data from the group of memory blocks.


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