The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Mar. 22, 2024
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

H. Jim Fulford, Marianna, FL (US);

Daniel Fulford, Albany, NY (US);

Mark I. Gardner, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9503 (2013.01); G01N 21/8806 (2013.01); G01N 2201/0636 (2013.01);
Abstract

Aspects of the present disclosure provide an apparatus. For example, the apparatus can include a wafer holder for holding a wafer, a light reflection device located beside a wafer edge and having a light reflection surface tilted with respect to a wafer surface, and a coherent light source for generating incident light to perform a scan on the wafer surface and the light reflection surface, which can reflect the incident light to generate reflection light, which can be detected by a light detector. The coherent light source, the light reflection device and the light detector can be arranged such that the incident light passes by the wafer edge and the reflection light generated by the light reflection surface is detected by the light detector or the reflection light generated by the light reflection surface passes by the wafer edge and is detected by the light detector.


Find Patent Forward Citations

Loading…