The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jul. 21, 2023
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Naoki Matsumoto, Kurokawa-gun, JP;

Toshihisa Ozu, Kurokawa-gun, JP;

Satoru Nakamura, Kurokawa-gun, JP;

Yusuke Shimizu, Kurokawa-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); G01M 3/00 (2006.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32935 (2013.01); G01M 3/002 (2013.01); G01N 25/72 (2013.01);
Abstract

The present disclosure provides a detection method implemented in a plasma processing apparatus. The plasma processing apparatus comprising a plasma processing chamber, a substrate support disposed in the plasma processing chamber and a plurality of heaters disposed in the substrate support, the detection method comprising: disposing a substrate on the substrate support; performing plasma processing by generating plasma in the plasma processing chamber; measuring temperatures of each of the plurality of heaters with a plasma being formed in the plasma processing chamber; and detecting a significant point in the substrate support based on the measured temperatures of the plurality of heaters.


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