The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Mar. 24, 2023
Applicant:

Shin-etsu Chemical Co., Ltd., Tokyo, JP;

Inventors:

Takeshi Sasami, Joetsu, JP;

Masayoshi Sagehashi, Joetsu, JP;

Kenji Yamada, Joetsu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/039 (2006.01); C07C 381/12 (2006.01); C08F 220/18 (2006.01); C08F 220/22 (2006.01);
U.S. Cl.
CPC ...
G03F 7/039 (2013.01); C07C 381/12 (2013.01); C08F 220/1805 (2020.02); C08F 220/1806 (2020.02); C08F 220/1807 (2020.02); C08F 220/1808 (2020.02); C08F 220/1809 (2020.02); C08F 220/22 (2013.01); G03F 7/0392 (2013.01);
Abstract

The present invention is a resist composition, including: a resin (A) having: a repeating unit represented by the general formula (p-1); a repeating unit represented by the general formula (a-1); and a repeating unit represented by the general formula (b-1); a resin (B) having: a repeating unit represented by the general formula (p-2); a repeating unit represented by the general formula (a-1); and a repeating unit represented by the general formula (b-1); and a solvent (D), wherein a content of the resin (A) contained in the resist composition is smaller than a content of the resin (B). This provides a resist composition that reduces roughness and size uniformity of a hole pattern with high resolution exceeding that of conventional resist materials even with a high exposure-dose region, that has good pattern shape after exposure, and that has excellent etching resistance.


Find Patent Forward Citations

Sasami, Takeshi. (2026). Resist composition and patterning process (U.S. Patent No. 12656683). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12656683

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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