The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Sep. 30, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Collin Howder, Boise, ID (US);

Yiping Wang, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/522 (2006.01); H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 27/11556 (2017.01); H01L 27/11582 (2017.01); H10B 41/27 (2023.01); H10B 43/27 (2023.01); H10W 20/00 (2026.01); H10W 20/42 (2026.01); H10W 20/47 (2026.01);
U.S. Cl.
CPC ...
H10W 20/42 (2026.01); H10B 41/27 (2023.02); H10B 43/27 (2023.02); H10W 20/081 (2026.01); H10W 20/082 (2026.01); H10W 20/083 (2026.01); H10W 20/47 (2026.01);
Abstract

A microelectronic device comprises a stack structure, a staircase structure, a first liner material, a liner structure, conductive contact structures, and barrier structures. The stack structure comprises vertically alternating conductive structures and insulative structures arranged in tiers. Each of the tiers individually comprises one of the conductive structures and one of the insulative structures. The staircase structure has steps comprising edges of at least some of the tiers of the stack structure. The first liner material is on the steps of the staircase structure, and the liner structure on the first liner material. The conductive contact structures extend through the first liner material and the liner structure and to the conductive structures of the stack structure. The barrier structures are between the conductive contact structures and the liner structure and vertically span substantially the same tiers of the stack structure as the liner structure. Memory devices, electronic systems, and methods of forming microelectronic devices are also described.


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