The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Mar. 07, 2023
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kandabara Tapily, Albany, NY (US);

Jeffrey Smith, Albany, NY (US);

Robert D Clark, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H10W 20/00 (2026.01); H10W 20/46 (2026.01);
U.S. Cl.
CPC ...
H10W 20/46 (2026.01); H10W 20/072 (2026.01); H10W 20/077 (2026.01);
Abstract

A method of forming a semiconductor device with air gaps for low capacitance interconnects. The method includes providing a substrate containing raised metal features with a top area and a sidewall, and a void between the raised metal features, filling the void with a sacrificial fill material, and selectively depositing a blocking layer on the sacrificial fill material. The method further includes depositing a cap layer on the top area of the raised metal features, where the cap layer has an overhang that extends past the sidewall, removing the blocking layer and the sacrificial fill material between the raised metal features, and depositing a dielectric film, where the dielectric film forms an air gap between the raised metal features below the overhang.


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