The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jan. 05, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Shih-Wei Liang, Taichung City, TW;

Nien-Fang Wu, Chiayi City, TW;

Jiun-Yi Wu, Taoyuan City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/10 (2006.01); H01L 21/48 (2006.01); H01L 23/00 (2006.01); H01L 25/065 (2023.01);
U.S. Cl.
CPC ...
H01L 23/10 (2013.01); H01L 21/4817 (2013.01); H01L 24/03 (2013.01); H01L 24/08 (2013.01); H01L 24/09 (2013.01); H01L 24/80 (2013.01); H01L 24/94 (2013.01); H01L 25/0657 (2013.01); H01L 2224/03616 (2013.01); H01L 2224/0801 (2013.01); H01L 2224/08059 (2013.01); H01L 2224/08145 (2013.01); H01L 2224/0903 (2013.01); H01L 2224/09051 (2013.01); H01L 2224/09517 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01); H01L 2224/94 (2013.01); H01L 2225/06524 (2013.01); H01L 2225/06527 (2013.01); H01L 2924/3512 (2013.01);
Abstract

A semiconductor device structure is provided. The semiconductor device structure includes a substrate having a device region and a seal ring region surrounding the device region. The semiconductor device structure includes a seal ring structure over the seal ring region. The seal ring structure surrounds the device region. The semiconductor device structure includes a bonding film over the seal ring structure and the substrate. The semiconductor device structure includes a bonding pad embedded in the bonding film. The bonding pad overlaps the seal ring structure along an axis perpendicular to a first top surface of the substrate, and a second top surface of the bonding pad is substantially level with a third top surface of the bonding film.


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